Sustainability, innovation to be in focus at AATCC 2023 summit in US

The American Association of Textile Chemists and Colorists (AATCC) has announced that its 2023 Textile Discovery Summit will be held from September 12-14 in the downtown district of Greenville, South Carolina. With the focus on supporting sustainability through innovation, this year's conference will be a groundbreaking event for the textile industry.

Attendees of the summit will have the opportunity to engage in educational presentations, stimulating networking receptions, insightful breakout sessions, and witness the latest advancements in textile technology at the exhibitor showroom. Furthermore, participants will be able to explore cutting-edge research and talent at the poster session, while witnessing the unveiling of the winners of the Herman & Myrtle Goldstein Graduate Student Paper Competition during the awards luncheon. 

The NC170 session "Research Personal Protective Technologies for Current and Emerging Occupational and Environmental Hazards," will address the critical need for effective Personal Protective Equipment (PPE) across industries such as firefighting, healthcare, military, and more. NC170 aims to bridge the gap in research and innovation of PPE, promoting R&D of materials and product designs, and developing consensus standards for PPE to ensure the safety, welfare, and competitiveness of the nation. With twelve speakers from leading universities sharing their research in PPE, attendees will gain valuable insights into the advancements and future of protective technologies. Admission to the NC170 session is included with summit registration, providing a unique opportunity to learn and engage in this important field.

The 2023 Textile Discovery Summit is open to all individuals who wish to participate. Whether the participants are an industry professional, researcher, or textile enthusiast, this event will offer a unique platform to gain insights, foster collaboration, and stay informed about the latest developments in the field.